NDLI: Edge-on semiconductor x-ray detectors - towards high-rate counting computed tomography

Content Provider	IEEE Xplore Digital Library
Author	Roessl, Ewald Schlomka, Jens-Peter Proksa, Roland
Copyright Year	2008
Description	Author affiliation: Philips Research Europe - Hamburg, Sector Medical Imaging Systems, Röntgenstrasse 24-26, D-22335, Germany (Roessl, Ewald; Schlomka, Jens-Peter; Proksa, Roland)
Abstract	The main obstacle today for photon-counting x-ray computed tomography (CT) in the clinical domain is the large x-ray flux rate employed in commercial CT systems enabling ultra-low scanning times. State-of-the-art direct-conversion semiconductor detectors with dedicated readout ASICs are able to reach rates of up to 5–10 million recorded events per second and channel. The requirement coming from clinical CT would be around one billion primary events per second and square millimeter active detector surface. Decreasing the (transverse) pixel size of typically 1 $mm^{2}$ for medical CT down-to about 200 μm×200 μm is effective to reduce the count rates per channel. However, for pixel sizes around and below that level, a number of physical effects like K-escape or charge sharing set in with degrading effects on image quality and spectral information content of the transmission data. A possible way to bridge the gap of about one more order of magnitude in count rate is to apply the sub-structuring of the active sensor volume not only in the directions transverse to the x-ray beam but also along the beam. In this paper we present simulations for a so-called “edge-on” detection concept in which the different sensor layers (in different depths) are read out using independent channels. The main observation reported in this paper is that already a very simple concept of data acquisition or data usage suffices to reconstruct high-quality images with a noise increase restricted to the outermost parts of the object under consideration. The count-rate problem is severe only in the primary beam and in “the first few millimeters of object”, as the event rate is exponentially damped inside the patient, drastically reducing the remaining effective count rate per channel.
Starting Page	1748
Ending Page	1751
File Size	5054153
Page Count	4
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.4775113
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray detectors Computed tomography X-ray imaging Event detection Single photon emission computed tomography Biomedical imaging Pixel Degradation Image quality Bridges spectral K-edge imaging photon-counting count-rate problem
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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