NDLI: Fabrication and comparison GdS(Tb) and CsI(Tl) films for X-ray imaging detector application

Content Provider	IEEE Xplore Digital Library
Author	Bo Kyung Cha, Jeong-Hyun Shin, Jong Yul Kim, Hosang Jeon, Jun Hyung Bae, Cha-hun Lee, Sungho Chang, Hyoungtaek Kim, Byoung-Jik Kim, Gyuseong Cho,
Copyright Year	2008
Description	Author affiliation: Radiation Detection and Monitoring Department, Korea Institute of Nuclear Safety, Daejeon, Korea (Byoung-Jik Kim,) \|\| Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea 305-701 (Bo Kyung Cha,; Jeong-Hyun Shin,; Jong Yul Kim,; Hosang Jeon,; Jun Hyung Bae,; Cha-hun Lee,; Sungho Chang,; Hyoungtaek Kim,; Gyuseong Cho,)
Abstract	During the last decade, digital X-ray imaging systems have been replacing analog X-ray imaging systems of conventional X-ray film-screen combination for radiography applications. Indirect detection methods consisted of an X-ray converter (or a scintillator film) and photodiode arrays are more widely used in medical diagnoses and industrial fields. Two major scintillation materials such as terbium doped gadolinium oxysulfide (GdS:Tb, GOS) and thallium doped cesium iodide (CsI:Tl) are commonly used. In this work, GOS scintillator films were manufactured by mixing and thermal hardening of GdS:Tb powder, dispersion agent, hardening agent, and other organic additives. And CsI:Tl scintillator films with columnar structure were also fabricated by the thermal evaporation method. The scintillation properties, such as emission spectrum and light yield etc., of the GOS and CsI:Tl films were measured by X-ray luminescence and photo-luminescence (PL) methods. The maximum luminescent intensity of both scintillators was observed at 540–560nm wavelength. In order to investigate the imaging performances of both GOS and CsI:Tl films as converters of X-ray imaging detectors, both scintillator films were coupled with an CCD sensor. The light response to X-ray dose, signal-to-noise ratio (SNR), spatial resolution were measured and analyzed under the same X-ray conditions. As X-ray dose increases, the SNR curves showed linear relationship. And the spatial resolution of two scintillator films was resolved at 7∼8lp/mm.
Starting Page	1232
Ending Page	1235
File Size	3220218
Page Count	4
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.4774627
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fabrication X-ray imaging Spatial resolution X-ray detection X-ray detectors Wavelength measurement Diagnostic radiography Solid scintillation detectors Photodiodes Medical diagnosis
Content Type	Text
Resource Type	Article

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