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Content Provider | IEEE Xplore Digital Library |
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Author | Tibbelin, Sandra Badano, Aldo Danielsson, Mats |
Copyright Year | 2008 |
Description | Author affiliation: Department of Physics, The Royal Institute of Technology, Stockholm, Sweden (Tibbelin, Sandra; Danielsson, Mats) || NIBIB/CDRH Laboratory for the Assessment of Medical Imaging Systems, Division of Imaging and Applied Mathematics, Office of Science and Engineering Laboratories, Center for Devices and Radiological Health, U.S. Food and Drug Administration, USA (Badano, Aldo) |
Abstract | We plan to integrate a photon counting, large area, high spatial resolution, high efficiency detector in a system for pre-clinical SPECT. We are aiming for a high spatial resolution for the detector of around 20 μm. The agent for radiolabelling is assumed to be $^{125}I,$ with an emission peak at 27 keV, since it is readily available. The aim of this feasibility study was to optimize the scintillator and electronics. We consider a complementary metal-oxide-semiconductor (CMOS) circuit together with a columnar CsI scintillator. In our case CMOS is advantageous over CCD due to a more flexible readout and an opportunity for data processing and trigger logic at the pixel level. The position of the x-ray interaction in the scintillator can be estimated with high accuracy by fitting a two-dimensional Gaussian curve to the pixel hit-map. The goal of this study is to determine optimal scintillator thickness, pixel size, readout rate and the corresponding achievable spatial resolution. Results for a CsI thickness of 600 μm show a detection efficiency close to 90 % and a spatial resolution in the range of 20 μm. Optimum pixel size for this application is between 40 – 60 μm and as long as the readout speed exceeds 750 Hz the noise from the dark current will not be significant. |
Starting Page | 3975 |
Ending Page | 3979 |
File Size | 3909620 |
Page Count | 5 |
File Format | |
ISBN | 9781424427147 |
ISSN | 10957863 |
DOI | 10.1109/NSSMIC.2008.4774154 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2008-10-19 |
Publisher Place | Germany |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Single photon emission computed tomography Spatial resolution X-ray detection X-ray detectors Charge coupled devices X-ray imaging Optical imaging Physics Optoelectronic and photonic sensors Circuits |
Content Type | Text |
Resource Type | Article |
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