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Content Provider | IEEE Xplore Digital Library |
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Author | Bernstein, P. Hamet, J.-F. Thimont, Y. |
Copyright Year | 2002 |
Abstract | Transport measurements carried out on YBa2Cu3O7-delta films are compared to a model suggesting that the films boundary planes behave as rows of Josephson weak links. The obtained results suggest that, except if the films are very thin, the boundary planes do not consist of a single row but of superimposed rows across the film thickness, whose existence is attributed to extended defects generated by Y2O3 inclusions. An expression for the critical surface current density valid in a large temperature range above a threshold value and depending on T, Tc and the number of superimposed weak links rows is derived from this conclusion and found in good agreement with the measurements. The critical current densities measured below the threshold are accounted for supposing that the oxygen content is not uniform in the samples. |
Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
Starting Page | 3541 |
Ending Page | 3544 |
Page Count | 4 |
File Size | 194674 |
File Format | |
ISSN | 10518223 |
Volume Number | 19 |
Issue Number | 3 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2009-06-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Yttrium barium copper oxide Current measurement Density measurement Transistors Current density Temperature distribution Critical current density Magnetic films Electron microscopy Substrates ${\rm YBa}_{2}{\rm Cu}_{3}{\rm O}_{7-\delta}$ films Boundary planes critical current density Josephson weak links |
Content Type | Text |
Resource Type | Article |
Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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