NDLI: Nanohardness and crack resistance of HTS YBCO thin films

Content Provider	IEEE Xplore Digital Library
Author	Verdyan, A. Soifer, Y.M. Azoulay, J. Rabkin, E. Kazakevich, M.
Copyright Year	2002
Abstract	Nanoindentation and nanoscratching using atomic force microscope (AFM) were employed to study the local mechanical properties of high TC superconductors YBCO thin films featuring high critical current density. Two YBCO films sputtered on two different substrates featuring substantial different hardness and Young's modules (sapphire and SrTiO3) were studied. The microstructure and the mechanical properties such as hardness (H), Young's modulus (E) and scratch parameters were investigated. The intrinsic hardness and Young's modulus of YBCO thin films were found to be H /spl sim/ 8.5 GPa, and E /spl sim/ 210 GPa, respectively. The substrate's influences on the mechanical parameters were found to be insignificant as long as the indentation penetration depth was below approximately 25% of the film thickness.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3585
Ending Page	3588
Page Count	4
File Size	246853
File Format	PDF
ISSN	10518223
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	High temperature superconductors Yttrium barium copper oxide Transistors Sputtering Superconducting thin films Atomic force microscopy Mechanical factors Critical current density Superconducting films Substrates thin films Cracking high Tc superconductors mechanical properties nanoindentation
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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