NDLI: Measurement of residual magnetic field by superconducting magnets of the LHD

Content Provider	IEEE Xplore Digital Library
Author	Imagawa, S. Takahata, K. Yanagi, N. Mito, T.
Copyright Year	2002
Abstract	After irregular excitations of superconducting magnets of the Large Helical Device, the residual magnetic field prevents uniform glow discharging in a plasma vacuum vessel. In order to measure the changes of residual field, fifteen Hall probes were installed at five periodic positions in three directions on the mid-plane of the inner cylinder of the cryostat. After the first excitation of the magnets in the cooling cycle, the residual field was changed by 0.1 mT at all positions. The direction was the same as the field during the excitation. After the excitation without helical coils, the residual field was clearly changed. During warm-up of the superconducting magnets, the additional residual field disappeared at the same time of the transition to a normal state. The additional residual field can be induced by magnetization of the superconducting magnets. The magnetic field by magnetization of NbTi filaments in the magnets has been calculated and compared with the measured data.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	1419
Ending Page	1422
Page Count	4
File Size	295065
File Format	PDF
ISSN	10518223
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetic field measurement Superconducting magnets Plasma measurements Magnetization Plasma devices Position measurement Hall effect devices Cooling Superconducting coils Niobium compounds superconducting magnet magnetization NbTi
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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