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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Lee, P.J. Fischer, C.M. Naus, M.T. Squitieri, A.A. Larbalestier, D.C. |
| Copyright Year | 2002 |
| Abstract | Recent advances in Nb/sub 3/Sn conductor development have advanced the non-Cu critical current density, J/sub c/, from 2000 A/mm/sup 2/ to almost 3000 A/mm/sup 2/ (12 T, 4.2 K). We have quantified a variety of state of the art composites for their microstructures using the fracture/field emission scanning electron microscope, FESEM, technique and their microchemistry using energy dispersive X-ray spectroscopy (EDS)/FESEM. The results of the measurements increasingly point to the importance of A15 composition in determining the critical current density as well as grain size. The highest critical current densities, however, are being attained by the internal Sn process which has yet to achieve as high a level of Sn (23-24.5 at.% Sn) in the A15 as for powder-in-tube (PIT) in which we measure as high as 25-26 at.% Sn. When Sn diffuses into the Cu stabilizer, it is found to have a great affinity for Nb/sub 3/Sn formation than dissolution into the Cu. A15 forms at the Nb-stabilizer surface with local Cu concentrations within the grains of the stabilizer of less than 0.1 at.% Cu. Elevated levels of Sn, however, were observed at the Cu grain boundaries. Both the quantified variations in composition and the peak levels of Sn indicate that further increases in performance should be expected. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 3422 |
| Ending Page | 3425 |
| Page Count | 4 |
| File Size | 437768 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 13 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Microstructure Critical current Niobium Tin Critical current density Density measurement Current measurement Conductors Electron emission Scanning electron microscopy |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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