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Content Provider | IEEE Xplore Digital Library |
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Author | Usoskin, A. Freyhardt, H.C. Issaev, A. Dzick, J. Knoke, J. Oomen, M.P. Leghissa, M. Neumueller, H.-W. |
Copyright Year | 2002 |
Abstract | Recent progress in developing large area HTS-coated stainless steel tapes is reported. YBCO films have been grown on IBAD-YSZ buffered 0.1 mm-thick steel tapes using a high-rate pulsed-laser-deposition technique which allows a deposition rate up to 70 nm /spl middot/ m/sup 2//h. The coated conductors (CC) are provided with an optimized shunt layer and current contacts which reduce the generation of Joule's heat. An advanced technique for critical current I/sub c/ measurements was developed. The effects of self-field and time relaxation of current in helically wound tapes are analyzed. In long tapes of 10 m /spl times/ 4 mm, the highest I/sub c/ of 78 A at 77 K was observed. Critical currents of 67-75 A were reproducibly achieved in (8-10) m /spl times/ 4 mm coated tapes. For shorter tapes with a length of 0.2-1 m, critical currents of 317-391 A/cm width of the tape were observed. Fifteen wider CC tapes of 0.6 m /spl times/ 43 mm with I/sub c/ = 700 A have been manufactured and employed in newly developed fault current limiters with a nominal current of 3 kA. Critical current densities J/sub c/ = (1.3-2.5) MA/cm/sup 2/ at 77 K were observed in YBCO films. The CC tapes exhibit favorable behavior under axial stress and sufficiently small ac losses. |
Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
Starting Page | 2452 |
Ending Page | 2457 |
Page Count | 6 |
File Size | 379443 |
File Format | |
ISSN | 10518223 |
Volume Number | 13 |
Issue Number | 2 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2003-06-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Steel Critical current Yttrium barium copper oxide Conductors Current measurement Wounds Manufacturing Fault current limiters Critical current density Stress |
Content Type | Text |
Resource Type | Article |
Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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