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Content Provider | IEEE Xplore Digital Library |
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Author | Huolin Huang Yannan Xie Zhengyun Wu |
Copyright Year | 2010 |
Description | Author affiliation: Department of Physics, Xiamen University, China (Huolin Huang; Yannan Xie; Zhengyun Wu) |
Abstract | TiO2 thin films were deposited on quartz substrates by electron beam evaporation and then annealed at 700°C for 1 h in air for the photodetector applications. Various characterization techniques were used to study the properties of the films. X-ray diffraction (XRD) and Raman results indicated that the post-annealed films exhibited single anatase phase and the grain size was 78 nm. Atomic force microscopy (AFM) and scanning electron microscopy (SEM) images showed that the films were smooth and compact. The UV-vis transparency spectra and photoluminescence (PL) spectra were applied to analyze the optical properties and emission features of the films. These results suggest the TiO2 thin films prepared in our experiments are a promising candidate material for the photodetector applications. |
Starting Page | 1222 |
Ending Page | 1223 |
File Size | 114537 |
Page Count | 2 |
File Format | |
ISBN | 9781424435432 |
DOI | 10.1109/INEC.2010.5424941 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2010-01-03 |
Publisher Place | China |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Atomic force microscopy Scanning electron microscopy Annealing X-ray scattering Electron beams X-ray diffraction Photodetectors Optical films Sputtering X-ray imaging |
Content Type | Text |
Resource Type | Article |
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