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Content Provider | IEEE Xplore Digital Library |
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Author | Dahyun Nam Gansukh, M. Hye Rim Choi Jihye Gwak SeJin Ahn Jae Ho Yun Kyunghoon Yoon Hyeonsik Cheong |
Copyright Year | 2013 |
Description | Author affiliation: Korea Inst. of Energy Res., Daejeon, South Korea (Hye Rim Choi; Jihye Gwak; SeJin Ahn; Jae Ho Yun; Kyunghoon Yoon) || Dept. of Phys., Sogang Univ., Seoul, South Korea (Dahyun Nam; Gansukh, M.; Hyeonsik Cheong) |
Abstract | We prepared CZTSe thin films by the co-evaporation method. In order to investigate the presence of various kinds of secondary phases, we also prepared reference ZnSe, SnSe, CuSnSe, and CuSe thin films in the same way. The depth dependence of the secondary phases was investigated by preparing samples that are sputtered to various depths. We used Raman spectroscopy measurement with several lasers to detect secondary phases. CZTSe films were compared with the reference films, and only ZnSe and $MoSe_{2}$ phases were detected. The relative amount of ZnSe varied with the depth from the sample surface. The ZnSe Raman peak seems to originate from the top and the bottom of the sample since the signal decreased initially and then increased as deeper parts of the film were probed. Intensity of CZTSe peak did not change much until the bottom part of the sample was reached and the $MoSe_{2}$ peak appeared. |
Sponsorship | IEEE Electron Devices Soc. |
Starting Page | 2625 |
Ending Page | 2627 |
File Size | 815067 |
Page Count | 3 |
File Format | |
DOI | 10.1109/PVSC.2013.6745012 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2013-06-16 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Films Lasers Measurement by laser beam Zinc Tin Raman scattering Photovoltaic cells Raman spectroscopy CZTSe thin films solar cells secondary phases ZnSe |
Content Type | Text |
Resource Type | Article |
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