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Content Provider | IEEE Xplore Digital Library |
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Author | Amberg, B. Vetter, T. |
Copyright Year | 2011 |
Description | Author affiliation: University of Basel, Switzerland (Amberg, B.; Vetter, T.) |
Abstract | Fitting statistical 2D and 3D shape models to images is necessary for a variety of tasks, such as video editing and face recognition. Much progress has been made on local fitting from an initial guess, but determining a close enough initial guess is still an open problem. One approach is to detect distinct landmarks in the image and initalize the model fit from these correspondences. This is difficult, because detection of landmarks based only on the local appearance is inherently ambiguous. This makes it necessary to use global shape information for the detections. We propose a method to solve the combinatorial problem of selecting out of a large number of candidate landmark detections the configuration which is best supported by a shape model. Our method, as opposed to previous approaches, always finds the globally optimal configuration. The algorithm can be applied to a very general class of shape models and is independent of the underlying feature point detector. Its theoretic optimality is shown, and it is evaluated on a large face dataset. |
Starting Page | 455 |
Ending Page | 462 |
File Size | 2475448 |
Page Count | 8 |
File Format | |
ISBN | 9781457711015 |
ISSN | 15505499 |
e-ISBN | 9781457711022 |
DOI | 10.1109/ICCV.2011.6126275 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2011-11-06 |
Publisher Place | Spain |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Detectors Shape Face Three dimensional displays Solid modeling Cost function Feature extraction |
Content Type | Text |
Resource Type | Article |
Subject | Computer Vision and Pattern Recognition Software |
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