NDLI: Second Test Coil for the Development of a Compact 3 T <formula formulatype=inline><tex Notation=TeX>$ hbox{MgB}

Content Provider	IEEE Xplore Digital Library
Author	Mine, S. Minfeng Xu Buresh, S. Stautner, W. Immer, C. Laskaris, E.T. Amm, K. Grasso, G.
Copyright Year	2002
Abstract	The authors have reported the results of low n -value from a MgB₂ test coil developed a year ago. A second test coil has been developed with wire of different structure and manufacturing process. Although the n-value related voltage of the second test coil was lower than the first test coil at designed current, it still showed low n-value. A third test coil has been wound with reduced mechanical stress. It also showed very similar n-value related voltage and n-value. Investigation of voltage distribution over the coil indicated that magnetic field was the major factor causing degradation of the n-value and resulting in n -value related voltages. Since the n-value related coil voltages were on the order of 0.1 μV/cm, the usual short sample I_c test (1 μV/cm was the definition of I_c ) might not detect the n-value related voltage and might not be able to investigate the cause of low n -value. Therefore, the medium length ( ~ 10 m) samples were tested and they showed the wire's lengthwise nonuniformity both on n-value and I_c, which might be another potential cause of the low n-value of the coil. Along with the electrical investigation, the manufacturing process of the wire was carefully inspected for longitudinal uniformity. Some wire segment samples from the same batch exhibited nonuniformity in the particle size distribution resulting in nonuniform filaments. This might have occurred in the wire for the second and third test coils.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	4601404
Ending Page	4601404
Page Count	1
File Size	631907
File Format	PDF
ISSN	10518223
Volume Number	23
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Coils Wires Integrated circuits Voltage measurement Copper Superconducting magnets Windings superconducting magnet Conduction cooling critical current critical temperature cryo-cooler $\hbox{MgB}_{2}$ n-value
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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