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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Paladugu, M. Zou, J. Wang, H. Auchterlonie, G.J. Kim, Y. Joyce, H.J. Gao, Q. Tan, H.H. Jagadish, C. |
| Copyright Year | 2006 |
| Description | Author affiliation: Sch. of Eng. & Centre for Microscopy & Microanal., Queensland Univ., St. Lucia, Qld. (Paladugu, M.; Zou, J.; Wang, H.; Auchterlonie, G.J.) |
| Abstract | The kinks formation in heterostructural nanowires was observed to be dominant when InAs nanowires were grown on GaAs nanowires. Nanowires were grown through vapor-liquid-solid (VLS) mechanism in an MOCVD (metalorganic chemical vapor deposition) reactor. GaAs nanowires were grown in [1 1 1 ]B direction on a GaAs (1 1 1 )B substrate. When InAs nanowires grown on the GaAs nanowires, most of the InAs nanowires changed their growth directions from [1 1 1 ]B to other <111>B directions. The kinks formation is ascribed to the large compressive misfit strain at the GaAs/InAs interface (7.2% lattice mismatch between GaAs and InAs) and the high mobility of indium species during MOCVD growth. The in-depth analysis of the kinks formation was done by growing InAs for short times on the GaAs nanowires and characterizing the samples. The hindrance to compressively strain InAs to form coherent layers with GaAs pushed the InAs/Au interfaces to the sides of the GaAs nanowires growth ends. New InAs/Au interfaces have generated at the sides of GaAs nanowires, due to lateral growth of InAs on GaAs nanowires. These new interfaces led the InAs nanowires growth in other <111>B directions. The morphological and structural features of these heterostructural kinked nanowires were characterized using scanning electron microscopy (SEM) and transmission electron microscopy (TEM) techniques. |
| File Size | 259122 |
| File Format | |
| ISBN | 1424404525 |
| DOI | 10.1109/ICONN.2006.340689 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-07-03 |
| Publisher Place | Australia |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Scanning electron microscopy Gold Transmission electron microscopy Gallium arsenide Lattices Capacitive sensors Nanowires MOCVD Chemical vapor deposition Inductors |
| Content Type | Text |
| Resource Type | Article |
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