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Content Provider | IEEE Xplore Digital Library |
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Author | Repchankova, A. Iannacci, J. |
Copyright Year | 2009 |
Description | Author affiliation: DISI Università di Trento, Via Sommarive 14, 38100 Italy (Repchankova, A.) || Fondazione Bruno Kessler, MemSRaD Via Sommarive 18, 38100 Italy (Iannacci, J.) |
Abstract | Stiction of MEMS (MicroElectroMechanical System) switches for RF (Radio Frequency) applications is a critical issue as it may jeopardize temporarily or permanently the operability of such devices. In this work we present a novel mechanism to enable the self-recovery of RF-MEMS switches in case of stiction. It is based on the application of a restoring force on the stuck membrane, induced by the thermal stress due to self-heating of the switch itself. The heat is generated by a current driven through a high resistivity polysilicon serpentine housed underneath the anchoring points of the suspended switch. After a detailed theoretical analysis, we will report FEM-simulation results (Finite Element Method) describing the behaviour of the structure discussed in this paper. |
Starting Page | 176 |
Ending Page | 181 |
File Size | 595513 |
Page Count | 6 |
File Format | |
ISBN | 9781424438747 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2009-04-01 |
Publisher Place | Italy |
Access Restriction | Subscribed |
Rights Holder | EDA Publishing |
Subject Keyword | Microelectromechanical systems Switches Conductivity Radiofrequency microelectromechanical systems Heat recovery Radio frequency Micromechanical devices self-recovery mechanism Thermal force Biomembranes RF-MEMS switch Thermal stresses stiction |
Content Type | Text |
Resource Type | Article |
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