NDLI: Logit-transformation Based Confidence Intervals for the Sensitivity of a Continuous-scale Diagnostic Test

Content Provider	IEEE Xplore Digital Library
Author	Jihye Kim Gengsheng Qin
Copyright Year	2008
Description	Author affiliation: Georgia State Univ., Atlanta, GA (Jihye Kim; Gengsheng Qin)
Abstract	In the field of modern medicine, diagnostic tests play an important role in detecting diseased patients. The diagnostic accuracy of a test is measured by its sensitivity and specificity. In this paper, we focus on the interval estimation for the sensitivity of a continuous-scale diagnostic test at a fixed level of its specificity. We propose two logit-transformation based confidence intervals for the sensitivity of a test and compare them with two of the best existing intervals (BTI and BTII) proposed by Zhou and Qin. Our simulation studies show that the newly proposed logit- transformation based intervals (LTI and LTII) have shorter interval lengths than the existing BTI and BTII intervals. The applications of the new intervals are illustrated in two real examples.
Starting Page	768
Ending Page	772
File Size	301208
Page Count	5
File Format	PDF
ISBN	9780769531182
DOI	10.1109/BMEI.2008.348
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-27
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Medical simulation Biomedical informatics Life estimation Sensitivity and specificity Medical tests Biomedical measurements Medical diagnostic imaging Testing Diseases Biomedical engineering
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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