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Content Provider | IEEE Xplore Digital Library |
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Author | Yan Wang Yi Sun Wenxing Zhang |
Copyright Year | 2009 |
Abstract | Automatic inspection of small components on loaded Printed Circuit Board (PCB) is difficult due to the requirements of precision and high speed. In this paper, a mean-shift and Support Vector Machine (SVM) based method for inspection of small components on loaded PCB is presented. Firstly, the images of small components are smoothened using mean-shift method and then their binary images are obtained by adaptive segmentation algorithm. Next, some features are extracted from the binary images and are input to a trained SVM to diagnose whether the small components are located correctly. The experimental results show that the proposed approach is effective and feasible to inspect small components on loaded PCB. |
Starting Page | 195 |
Ending Page | 198 |
File Size | 1051020 |
Page Count | 4 |
File Format | |
ISBN | 9780769537368 |
DOI | 10.1109/ICNC.2009.407 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2009-08-14 |
Publisher Place | China |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Printed circuits Humans Inspection printed circuit board automatic inspection Sun Support vector machines Manufacturing industries Image segmentation support vector machine Support vector machine classification Feature extraction Kernel Mean-shift |
Content Type | Text |
Resource Type | Article |
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