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Content Provider | IEEE Xplore Digital Library |
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Author | Devarakond, S. Banerjee, D. Banerjee, A. Sen, S. Chatterjee, A. |
Copyright Year | 2013 |
Description | Author affiliation: Georgia Inst. of Technol., Atlanta, GA, USA (Devarakond, S.; Banerjee, D.; Banerjee, A.; Chatterjee, A.) || Intel Circuits & Syst. Res. Labs., Hillsboro, OR, USA (Sen, S.) |
Abstract | A low cost methodology for simultaneous testing and tuning of multiple chains of MIMO-OFDM wireless transmitter for system-level specifications is presented. Bandwidth-partitioned test stimuli enable the determination of the behavioral characteristics of the different chains of the RF transmitter using a one-time data acquisition. The determined behavioral characteristics of the transmitters are then correlated to system-level specifications in the simulation environment. Using the test setup, a power conscious system-level tuning approach for yield improvement is developed for tuning of parametric deviations. A yield improvement of 20% is obtained using the proposed methodology. Finally, an adaptive tuning approach is presented for those devices that face increased reliability risks/power-budget violations due to the excessive power consumption caused by post-manufacturing tuning. The tuning methodology achieves new performance metrics for these devices that attempt to maximize the conditions under which the device operates. Significant improvement in yield is obtained using the adaptive tuning methodology. Preliminary hardware validation of the proposed methodology using off the shelf components is performed. |
Sponsorship | Qualcomm |
Starting Page | 1 |
Ending Page | 6 |
File Size | 896913 |
Page Count | 6 |
File Format | |
ISBN | 9781467363761 |
e-ISBN | 9781467363778 |
DOI | 10.1109/ETS.2013.6569363 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2013-05-27 |
Publisher Place | France |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Tuning Radio frequency MIMO Transmitters Performance evaluation Power demand Testing |
Content Type | Text |
Resource Type | Article |
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