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Content Provider | IEEE Xplore Digital Library |
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Author | Lisenker, B. Mitnick, Y. |
Copyright Year | 1999 |
Description | Author affiliation: Intel Israel (74) Ltd., Haifa, Israel (Lisenker, B.) |
Abstract | A new fault model, based on the general percolation theory applied to long-channel CMOS VLSI circuits, has been recently introduced. It was shown that a reliability risk appears only when process-related defects create a pattern independent current path in standby mode. An acceptable reliability risk defines a pass/fail criteria. A screening technique, based on this model, presents a strong correlation between rejected devices and early failure rate. In this paper, the general percolation approach was applied to short-channel CMOS VLSI circuits. Unlike long-channel CMOS VLSI, defect-free short-channel CMOS VLSI circuits inherently have a pattern independent standby current, which results from a short-channel MOSFET current in the off state. In this case, the defect related component of this current may be released only by means of a multi-parameter failure criterion. Experimental results that confirm this conclusion are presented and discussed. The reliability risk assessment technique employing this model shows a strong correlation between rejected devices and long term reliability for 32-bit 0.35 /spl mu/m CMOS microprocessors. |
Starting Page | 319 |
Ending Page | 326 |
File Size | 660633 |
Page Count | 8 |
File Format | |
ISBN | 0780352203 |
DOI | 10.1109/RELPHY.1999.761633 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1999-03-23 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Circuit faults Very large scale integration Semiconductor device modeling CMOS technology MOSFET circuits Ultra large scale integration Testing Monitoring Integrated circuit reliability Integrated circuit interconnections |
Content Type | Text |
Resource Type | Article |
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