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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yafei Wen Changqing Zou Jianzhuang Liu Shuze Du Shifeng Chen |
| Copyright Year | 2014 |
| Description | Author affiliation: Shenzhen key Lab. of Comp. Vis.&Pat. Rec., Shenzhen Inst. of Adv. Technol., Shenzhen, China (Yafei Wen; Jianzhuang Liu; Shifeng Chen) || Chengdu Inst. of Comput. Applic., Chengdu, China (Shuze Du) || Dept. of Phys. & Electron. Inf. Sci., Hengyang Normal Univ., Hengyang, China (Changqing Zou) |
| Abstract | Sketch-based 3D model retrieval provides a convenient way for users to search for 3D models by sketches. Traditionally, this task is converted to a sketch-based 2D shape retrieval problem by projecting 3D models to 2D images. Local invariant features have been widely used to tackle this problem. However, it suffers from the lack of global context and easily fails when images of different 3D models share multiple similar regions. In this paper, we propose a joint description by fusing local statistical structures and global spatial features. Our description is invariant to scale, translate and rotation. An improved bag-of-features retrieval framework is applied to explore semantic visual word representations. Besides, a novel relevance feedback scheme which combines weight balancing and query modification is designed to further improve the retrieval performance. We conduct various experiments on the common sketch-based watertight model benchmark. The comparative results show that our approach significantly outperforms three state-of-the-art methods, demonstrating its effectiveness and robustness for sketch-based 3D model retrieval. |
| Starting Page | 4570 |
| Ending Page | 4575 |
| File Size | 347454 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781479952090 |
| ISSN | 10514651 |
| DOI | 10.1109/ICPR.2014.782 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-08-24 |
| Publisher Place | Sweden |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Shape Three-dimensional displays Solid modeling Context Histograms Visualization Computational modeling shape descriptor 3D model retrieval bag-of-features feature fusion |
| Content Type | Text |
| Resource Type | Article |
| Subject | Computer Vision and Pattern Recognition |
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