NDLI: Confocal microscopy segmentation using active contour based on alpha(α)-divergence

Content Provider	IEEE Xplore Digital Library
Author	Meziou, L. Histace, A. Precioso, F. Matuszewski, B.J. Murphy, M.F.
Copyright Year	2011
Description	Author affiliation: ETIS UMR CNRS 8051, ENSEA, UCP, France (Meziou, L.; Histace, A.) \|\| ADSIP, UCLan, Preston, UK (Matuszewski, B.J.) \|\| GERI, Liverpool JMU, UK (Murphy, M.F.) \|\| LIP6 UMR CNRS 7606, UPMC, France (Precioso, F.)
Abstract	This paper describes a novel method for active contour segmentation based on foreground/background alpha-divergence histogram distance measure. In recent years a number of variational segmentation techniques have been proposed for a region based active contour segmentation utilising different distance measures between probability density functions (PDFs) describing foreground and background regions. The most common techniques use $χ^{2},$ Hellinger/Bhattacharya distances or Kullback-Leibler divergence. In this paper, it is proposed to generalize these methods by using the alpha-divergences distance function. This distance function depending on the selected value of its parameter encompasses mentioned above classical distances. The paper defines a partial differential equation, associated with alpha-divergence variational criterion, that governs the iterative deformations of the active contour. The experimental results on a synthetic data demonstrate that the proposed method outperforms previously proposed histogram based methods in terms of segmentation accuracy and robustness with respect to type and level of noise. The potential of the proposed technique for segmentation of cellular structures in fluorescence confocal microscopy data is also illustrated.
Starting Page	3077
Ending Page	3080
File Size	2514050
Page Count	4
File Format	PDF
ISBN	9781457713040
ISSN	15224880
e-ISBN	9781457713033
e-ISBN	9781457713026
DOI	10.1109/ICIP.2011.6116315
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-09-11
Publisher Place	Belgium
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Image segmentation Active contours Noise Microscopy Histograms Biomedical imaging confocal microscopy Segmentation active contour alpha-divergence
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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