NDLI: Measurement of surface roughness dependence of thermal contact resistance under low pressure condition

Content Provider	IEEE Xplore Digital Library
Author	Azuma, K. Hatakeyama, T. Nakagawa, S.
Copyright Year	2015
Description	Author affiliation: Dept. of Mech. Syst. Eng., Toyama Prefectural Univ., Kurokawa, Japan (Azuma, K.; Hatakeyama, T.; Nakagawa, S.)
Abstract	Recently, thermal design of electrical equipment is important. Thermal contact resistance is one of the important parameters in the thermal design. However, thermal contact resistance is dependent on various factors, for example surface roughness, the contact pressure and the hardness of the material. Therefore, quantitative evaluation is difficult, and a little information can be obtained under high pressure conditions. In this study, we examine surface roughness and material hardness dependence of thermal contact resistance under low pressure condition. The materials to be measured are Al1070 and S45C, and three patterns (Ra = 0.2, 3.2, 12.5) of surface roughness are examined. Range of the contact pressure is 7.8 - 78 kPa. And, we have investigated the thermal resistance changed by contact pressure. From the experimental results, the reduction rate of the thermal contact resistance by increasing in pressure is dependent on the surface roughness, and thermal resistance of low hardness sample is saturated at higher contact pressure. Further, we discuss the relationship between the contact pressure and thermal resistance by the “Hertzian contact theory”. As a result, we confirm that the experimental results can be approximated by this equation.
Sponsorship	Japan Inst. Electron. Packag.
Starting Page	381
Ending Page	384
File Size	717401
Page Count	4
File Format	PDF
e-ISBN	9784904090138
DOI	10.1109/ICEP-IAAC.2015.7111040
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-04-14
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	The Japan Institute of Electronics Packaging
Subject Keyword	Hertzian contact theory Thermal resistance Surface resistance Thermal contact resistance Contact resistance Surface roughness Rough surfaces Electrical resistance measurement
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Impact wear of electric contact

The Effect of Initial Connector Insertions on Electrical Contact Resistance

Characterization of the Micro Contact Resistance using a Novel On-Chip Apparatus

Thermal contact resistance: effect of elastic deformation [microelectronics packaging]

Electrical Contact Resistance Considering Multi-Scale Roughness

A Contact Resistance Theory for Rough Hemispherical Silver Contacts in Air and in Vacuum

Apparatus for accurate measurement of interface resistance of high performance thermal interface materials

Experimental and theoretical study of creep effects in electrical contacts

Measurement and modelling of surface micromachined, electrostatically actuated microswitches

Measurement of surface roughness dependence of thermal contact resistance under low pressure condition

Similar Documents

Impact wear of electric contact

The Effect of Initial Connector Insertions on Electrical Contact Resistance

Characterization of the Micro Contact Resistance using a Novel On-Chip Apparatus

Thermal contact resistance: effect of elastic deformation [microelectronics packaging]

Electrical Contact Resistance Considering Multi-Scale Roughness

A Contact Resistance Theory for Rough Hemispherical Silver Contacts in Air and in Vacuum

Apparatus for accurate measurement of interface resistance of high performance thermal interface materials

Experimental and theoretical study of creep effects in electrical contacts

Measurement and modelling of surface micromachined, electrostatically actuated microswitches

Measurement of surface roughness dependence of thermal contact resistance under low pressure condition