NDLI: Statistical method based computer fault prediction model for large computer centers

Content Provider	IEEE Xplore Digital Library
Author	Zhixin Tie Hong Zhuang Qiang Luo Lingbing Tao
Copyright Year	2011
Description	Author affiliation: Instructional Division of Computer Technology, Zhejiang Sci-Tech University, Hangzhou, Zhejiang, 310018, P. R. China (Zhixin Tie; Hong Zhuang; Qiang Luo; Lingbing Tao)
Abstract	Computer laboratories in large computer centers play an important role for the computing education in higher education institutions. Due to heavy usage, there are often hardware or software problems on these computers. Thus computer laboratories management and maintenance is a very important and long-term task. For a computer laboratory, the computers' monthly used time follows the normal distribution, which is verified by the chi-square goodness-of-fit hypothesis test. According to probability distributions based on the normal distribution, a statistical method based computer fault prediction model for public computer laboratories is presented. Computers' health state is divided into four classes: the Normal state, the Concerning state, the Warning state, and the Fault state. For different levels of computer fault, different methods are used to maintain it. The experiment and application was conducted in a university computer center with hundreds of computers in 9 computer laboratories. The experiment and application results show that it is an effective way for finding fault computers. It can be used to guide computer maintenance. Computers maintenance workload is greatly reduced by using this fault prediction model.
Starting Page	960
Ending Page	964
File Size	422264
Page Count	5
File Format	PDF
ISBN	9781424497171
e-ISBN	9781424497188
DOI	10.1109/ICCSE.2011.6028795
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-08-03
Publisher Place	Singapore
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Computers Statistical method Statistical analysis Computational modeling Laboratories Normal distribution Computer laboratory Chi-square goodness-of-fit hypothesis test Predictive models Gaussian distribution Educational institutions Fault prediction
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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