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Content Provider | IEEE Xplore Digital Library |
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Author | Shiraki, H. Tokuda, Y. Sassa, K. |
Copyright Year | 1996 |
Description | Author affiliation: Adv. Technol. Res. Labs., Mitsubishi Mater. Corp., Saitama, Japan (Shiraki, H.) |
Abstract | The interaction between EL5 and EL6 was studied by using isothermal constant-capacitance voltage transient spectroscopy (CCVTS). Anomalous filling time dependence of CCVTS peak heights for two trap components of EL5 and EL6 was observed in a long range filling pulse duration. The decrement of one EL6 constituent was nearly equal to the increment of one EL5 constituent. This variation could be reversed by controlling electron occupation fractions of these traps. The calculation by rate equations based on a bistable reaction model could explain well such characteristic behaviors. |
Starting Page | 299 |
Ending Page | 302 |
File Size | 269820 |
Page Count | 4 |
File Format | |
ISBN | 0780331796 |
DOI | 10.1109/SIM.1996.571104 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1996-04-29 |
Publisher Place | France |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Electron traps Pulse measurements Gallium arsenide Voltage Charge carrier processes Filling Electron emission Kinetic theory Capacitance measurement Isothermal processes |
Content Type | Text |
Resource Type | Article |
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