NDLI: Ultra-low voltage digital circuit design: A comparative study

Content Provider	IEEE Xplore Digital Library
Author	Arthurs, A. Roark, J. Jia Di
Copyright Year	2012
Description	Author affiliation: Department of Computer Science and Computer Engineering, University of Arkansas, Fayetteville, AR 72701, USA (Arthurs, A.; Roark, J.; Jia Di)
Abstract	Ultra-low voltage digital circuit is an active research area that tailors portable applications. Such applications include wearable electronics, intelligent remote sensors, implantable medical devices, and energy-harvesting systems. Two major goals of such systems are minimized energy consumption and improved compatibility with low-voltage power supplies and analog components. The immediate solution to achieve these goals is to reduce the supply voltage, but doing so raises the issue of operability. At low supply voltages, the integrity of digital signals degrades dramatically due to the indifference between active and leakage currents. In addition, the system timing becomes more unpredictable as the impact of process/voltage/temperature variations being more significant at lower voltages. This paper presents a comparative study of two circuit- and architecture-level techniques that address digital signal integrity and system timing at ultra-low voltages, i.e., Schmitt-trigger gate structure and delay-insensitive asynchronous logic. Results from test circuits show that static designs have wider dynamic range, while Schmitt-trigger designs are capable of operating at lower voltages. In addition, for static designs the synchronous circuit performs better in energy. For Schmitt-trigger design the asynchronous circuit has advantage.
Starting Page	1
Ending Page	4
File Size	702982
Page Count	4
File Format	PDF
ISBN	9781467308229
e-ISBN	9781467308212
DOI	10.1109/FTFC.2012.6231717
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-06
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Delay-insensitive NULL Convention Logic Logic gates Ultra-low voltage Leakage current Schmitt-trigger CMOS integrated circuits Transistors Reliability Digital circuits Coprocessors Asynchronous logic
Content Type	Text
Resource Type	Article

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