NDLI: Impact of Overlapping Trajectories in Laser Micro-Polishing

Content Provider	IEEE Xplore Digital Library
Author	Chow, M.T.C. Knopf, G.K. Bordatchev, E.V.
Copyright Year	2014
Description	Author affiliation: Automotive & Surface Transp., London, ON, Canada (Bordatchev, E.V.) \|\| Dept. of Mech. & Mater. Eng., Univ. of Western Ontario, London, ON, Canada (Chow, M.T.C.; Knopf, G.K.)
Abstract	The quality of a laser micro-polished (LμP) surface is dependent upon the part material, initial surface topography and roughness, and the energy density of the beam used to produce a thin molten layer on the finished part. Prior research has shown that the amount of energy delivered to the work piece can also be controlled by adjusting the “focal offset distance” (FOD) of the laser optics. In this paper, the impact of using multiple overlapping trajectories for laser polishing on the average surface roughness (Ra) is investigated. The analysis is performed on ball-end micromilled H13 tool steel specimens polished using a nanosecond Q-switched Nd:YAG laser. The initial surface roughness is dependent on the height and width of micromilled scallops. The trajectory overlap percentage (TO%) is an advanced machining parameter used to describe the ratio between the size of the polishing step and the molten LμP diameter. The average surface roughness of the “best” experimental specimen was reduced from a Ra of 746 nm to 205 nm (~73% improvement) using a short distance polishing regime (1.3 mm <; FOD <; 1.8 mm) with a TO% = 96.8% (or 2 μm step trajectory). Similar, but less dramatic, reductions in profile Ra were also observed for the longer polishing regime (FOD > 2.2 mm). The experiments also illustrate that the quality of the final surface finish can be further improved by combining continuous wave laser polishing (CW-LP) and LμP.
Starting Page	174
Ending Page	178
File Size	624561
Page Count	5
File Format	PDF
ISBN	9781467367523
DOI	10.1109/ISOT.2014.49
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-11-05
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Multi-trajectory polishing Trajectory overlap percentage Laser micro-polishing Focal offset distance Surface emitting lasers Profile average surface roughness Surface roughness Rough surfaces Trajectory Laser beams Surface treatment Optical surface waves
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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