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Content Provider | IEEE Xplore Digital Library |
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Author | Bei Peng Guanzhong Huang Hao Li Peiyuan Wan Pingfen Lin |
Copyright Year | 2011 |
Description | Author affiliation: Beijing University of Technology, China (Bei Peng; Guanzhong Huang; Peiyuan Wan; Pingfen Lin) || University of Science and Technology of China, Hefei, China (Hao Li) |
Abstract | A 1.2 V 12-bit 150 MS/s pipelined ADC with low-gain op-amps (DC gain ≈15 dB) is fabricated in a 65-nm CMOS process. The proposed 5-transistor single stage op-amp enables simple analog circuit to achieve low power and high speed. Digital background calibration technique is exploited to compensate the inter-stage gain error, capacitor mismatch and op-amp nonlinearity. The ADC achieves a peak SNDR of 68 dB and 67 dB and a peak SFDR of 85 dB and 81 dB with 6 MHz input at 100 MS/s and 150 MS/s, respectively. The ADC analog core occupies 0.78 $mm^{2}$ and dissipates 36 mW at 150 MHz sampling rate from a 1.2-V supply. The digital calibration circuit occupies 0.21 $mm^{2}$ and dissipates 12 mW at a clock frequency of 150MHz by estimation with software. The ADC shows a FoM of 194 fJ/conv-step at 150-MS/s from a 1.2-V supply. |
Starting Page | 1 |
Ending Page | 4 |
File Size | 413627 |
Page Count | 4 |
File Format | |
ISBN | 9781457702228 |
ISSN | 08865930 |
e-ISBN | 9781457702235 |
DOI | 10.1109/CICC.2011.6055421 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2011-09-19 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Calibration Gain CMOS integrated circuits Capacitors CMOS technology Frequency measurement Analog circuits |
Content Type | Text |
Resource Type | Article |
Subject | Electrical and Electronic Engineering |
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