NDLI: Stochastic analysis of interconnect performance in the presence of process variations

Content Provider	IEEE Xplore Digital Library
Author	Wang, J. Ghanta, P. Vrudhula, S.
Copyright Year	2004
Description	Author affiliation: Dept. of ECE, Arizona Univ., Tucson, AZ, USA (Wang, J.; Ghanta, P.; Vrudhula, S.)
Abstract	Deformations in interconnect due to process variations can lead to significant performance degradation in deep sub-micron circuits. Timing analyzers attempt to capture the effects of variation on delay with simplified models. The timing verification of RC or RLC networks requires the substitution of such simplified models with spatial stochastic processes that capture the random nature of process variations. The present work proposes a new and viable method to compute the stochastic response of interconnects. The technique models the stochastic response in an infinite dimensional Hilbert space in terms of orthogonal polynomial expansions. A finite representation is obtained by using the Galerkin approach of minimizing the Hilbert space norm of the residual error. The key advance of the proposed method is that it provides a functional representation of the response of the system in terms of the random variables that represent the process variations. The proposed algorithm has been implemented in a procedure called OPERA, results from OPERA simulations on commercial design test cases match well with those from the classical Monte Carlo SPICE simulations and from perturbation methods. Additionally OPERA shows good computational efficiency: speedup factor of 60 has been observed over Monte Carlo SPICE simulations.
Starting Page	880
Ending Page	886
File Size	593493
Page Count	7
File Format	PDF
ISBN	0780387023
ISSN	10923152
DOI	10.1109/ICCAD.2004.1382698
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-11-07
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Stochastic processes Performance analysis Integrated circuit interconnections Computational modeling Timing Hilbert space Monte Carlo methods SPICE Degradation RLC circuits
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Software Computer Science Applications

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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