NDLI: TLP measurements for verification of ESD protection device response

Content Provider	IEEE Xplore Digital Library
Author	Hyatt, H. Harris, J. Alanzo, A. Bellew, P.
Copyright Year	2000
Description	Author affiliation: Littelfuse Inc., Des Plaines, IL, USA (Hyatt, H.)
Abstract	Transmission line pulsers, commonly known as TLPs, have been used for many years to calibrate diagnostics, and provide precise high-voltage and high-current waveforms. The pulsers have been used to qualify the ESD response of many ESD protection circuits and devices (Rector and Hyatt, 1998; Gieser and Egger, 1996; Maloney and Khurana, 1985). TLP applications cover a wider range of uses beyond estimating the ESD susceptibility of device level protection circuits. TLPs have been used to certify many ESD suppression devices including: device level ESD protection circuits, metal oxide varistors (MOV), Transorbs, composite voltage variable materials (VVM), diodes, spark gaps, and occasionally, even capacitors and resistors. This paper describes a simplified, yet general, TLP circuit and method called time domain transmission (TDT) mode testing. The method differs from and is compared to time domain reflection (TDR) mode measurement techniques.
Starting Page	111
Ending Page	120
File Size	822531
Page Count	10
File Format	PDF
ISBN	1585370185
DOI	10.1109/EOSESD.2000.890034
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-09-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	EOS/ESD Association, Inc.
Subject Keyword	Electrostatic discharge Protection Circuit testing Transmission line measurements Distributed parameter circuits Pulse circuits Varistors Voltage Composite materials Inorganic materials
Content Type	Text
Resource Type	Article

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