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Content Provider | IEEE Xplore Digital Library |
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Author | Jin He Xing Zhang Chan, M. Yangyuan Wang |
Copyright Year | 2006 |
Description | Author affiliation: Inst. of Micro-Electron., Peking Univ., Beijing (Jin He; Xing Zhang) |
Abstract | As traditional CMOS is gradually approaching the limit of the bulk technology scaling, non-classical CMOS devices such as UTB-SOI, DG-MOSFET and MG structure provide a path to scale CMOS to the end of the Roadmap using new transistor structural designs. Compact modeling of such non-classical MOSFET devices calls for a fundamentally different approach from the conventional bulk CMOS because of the different device physics picture and unique physical effects in the new topology of the non-classical CMOS devices. This paper outlines the carrier-based approach: A generous strategy to develop the compact model of non-classical MOSFETs. It is shown that the carrier-based analytic models of UTB-SOI, DG and SRG MOSFETs can be developed in terms of the induced carrier concentration rather than the traditional surface potential or the charge variable. Based on an exact solution of the Poisson equation in various non-classical structures coupled to the Pao-Sah current formulation in terms of the carrier concentration, the different dependences of the surface potential, centric potential, inversion charge and the current on the silicon body thickness and the gate oxide are elucidated analytically and then the predicted IV characteristics are compared with the 2-D and 3-D numerical simulations. The analytical results of the model presented show in a good agreement with the numerical simulation, demonstrating the model is valid for all operation regions and traces the transition between them without any auxiliary variable and function |
Starting Page | 167 |
Ending Page | 172 |
File Size | 7365226 |
Page Count | 6 |
File Format | |
ISBN | 1424400414 |
DOI | 10.1109/ICCDCS.2006.250855 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2006-04-26 |
Publisher Place | Mexico |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Semiconductor device modeling CMOS technology Physics Numerical simulation Silicon on insulator technology MOSFETs Topology Poisson equations Switches Circuits and systems Compact modeling Non-classical CMOS Device physics |
Content Type | Text |
Resource Type | Article |
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