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Content Provider | IEEE Xplore Digital Library |
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Author | Ran, Y. Kondratyev, A. Watanabe, Y. Marek-Sadowska, M. |
Copyright Year | 2004 |
Description | Author affiliation: Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA (Ran, Y.) |
Abstract | Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. Noise analysis techniques can detect some of such noise faults, but accurate analysis requires a careful examination of timing and functional properties of the circuit. This paper proposes a method to check the "true" noise impact on path delay. It uses four-variable Boolean logic to characterize signal transitions in a time interval, and formulates Boolean satisfiability between aggressors and a victim under the min-max delay model for gates. The proposed technique is scalable as it keeps the size of Boolean formulation linear to the size of the modeled circuit. By applying it to a set of large circuits, it has eliminated up to 50% of noise delay faults reported by conventional noise analysis method. |
Sponsorship | EDAA, EDA Consortium, IEEE Comput. Soc. TTTC IEEE Comput. Soc. DATC ECSI ACM/SIGDA RAS |
Starting Page | 1192 |
Ending Page | 1197 |
File Size | 283189 |
Page Count | 6 |
File Format | |
ISBN | 0769520855 |
ISSN | 15301591 |
DOI | 10.1109/DATE.2004.1269054 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2004-02-16 |
Publisher Place | France |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Crosstalk Delay Circuit noise Timing Circuit faults Boolean functions Radio access networks Latches Electrical fault detection Fault detection |
Content Type | Text |
Resource Type | Article |
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