NDLI: Automated High-Power RF Microwave Tube Test Stand

Content Provider	IEEE Xplore Digital Library
Author	Young, Andrew Rees, Daniel E.
Copyright Year	1994
Description	Author affiliation: Los Alamos National Laboratory, P.O. Box 1663, MS H827, Los Alamos, NM 87545 (Young, Andrew; Rees, Daniel E.)
Abstract	This paper describes an automated test stand used for testing the high-power klystron amplifiers for the Ground Test Accelerator (GTA). To verify klystron performance, we have developed an automated test system using data-acquisition and control programs based on LabVIEW¿, a program that readily interfaces with both the high-power transmitter¿s programmable logic controller and the GPIB interface test equipment. The automated test system also provides extensive analysis, improved data storage and processing, and documentation of the test conditions. This approach allows one to develop and operate a complex test system using an iconic-programming system. Three automated tests were developed and performed on the high-power klystron: swept-frequency, power-transfer, and voltage standing wave ration (VSWR) at several operating conditions. This paper describes the hardware used to test the klystrons, presents an example of the test data, provides block diagrams of the software used in the test stand, and characterizes all the capabilities for the automated test system. This test facility is being used by the GTA program to fully characterize the klystron amplifiers before they are placed into accelerator service, verify the factory acceptance tests, and determine optimal operating conditions for power levels below saturation. Currently, we are moving the test stand to the Los Alamos Meson Physics Facility (LAMPF) where we will test many klystrons used in their accelerator. These klystrons have been in operation for twenty years. Some of the amplifiers have been rebuilt and other amplifiers are in process of being retuned or decommissioned.
Starting Page	93
Ending Page	98
File Size	583460
Page Count	6
File Format	PDF
ISBN	0780356861
DOI	10.1109/ARFTG.1994.327063
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-05-27
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Radio frequency Automatic testing System testing Klystrons Software testing Life estimation High power amplifiers Radiofrequency amplifiers Logic testing Automatic control
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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