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Content Provider | IEEE Xplore Digital Library |
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Author | Leng, Q. Mao, M. Hiner, C. Miloslavsky, L. Miller, M. Tran, S. Qian, C. Tong, H.C. |
Copyright Year | 1965 |
Abstract | We have observed a 30% of enhancement in coercivity, H/sub c/, or a 40% increase in remnant magnetization in ion beam deposited (IBD) Cr/CoPt films as compared to IBD Cr/CoCrPt films. In addition, the magnetic properties of these hard bias films exhibit a strong dependence of on substrate and underlayer. Higher coercivity values associated with enhanced hcp Co (101~0) crystallographic orientation were measured in films grown on substrates in the preference order of glass, Si/Al/sub 2/O/sub 3/ and Si. CoPt films grown on CrV underlayer show lower H/sub c/ values than films deposited on Cr underlayer. H/sub c/ exhibits a maximum with increasing Cr underlayer thickness for both Cr/CoPt and Cr/CoCrPt films. This Cr thickness dependence of H/sub c/ is correlated well with that of Co (101~0)/(0002) X-ray diffraction peak intensity ratio, indicating the role of crystallographic texture in control of coercivity of IBD hard bias films. |
Sponsorship | IEEE Magnetics Society |
Starting Page | 2553 |
Ending Page | 2555 |
Page Count | 3 |
File Size | 309084 |
File Format | |
ISSN | 00189464 |
Volume Number | 35 |
Issue Number | 5 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1999-09-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Magnetic properties Ion beams Magnetic films Chromium Coercive force Semiconductor films Crystallography Magnetization Glass X-ray diffraction |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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