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Content Provider | IEEE Xplore Digital Library |
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Author | Wang, S.X. Bailey, W.E. Surgers, C. |
Copyright Year | 1965 |
Abstract | NiO exchange-biased "bottom" spin valves of the type NiO/NiFe/Co/Cu/Co/NiFe and FeMn exchange-biased "top" spin valves of the type NiFe/Co/Cu/Co/NiFe/FeMn were deposited by ion-beam deposition (except the NiO layer). Their magnetic properties, magneto-transport, and microstructures are characterized and compared with corresponding GMR spin valves deposited by dc magnetron sputtering. High-resolution cross-sectional transmission electron microscopy and X-ray diffraction reveal microstructural differences between ion-beam-deposited and dc magnetron sputtered spin valves. In particular, film texture, surface morphology, GMR ratio, exchange bias, interlayer coupling strength, and coercivity vary widely, but property-structure-processing correlation can be identified. A GMR ratio of /spl sim/9.7% was obtained on random textured NiO exchange-biased bottom spin valves by ion-beam deposition. |
Sponsorship | IEEE Magnetics Society |
Starting Page | 2369 |
Ending Page | 2374 |
Page Count | 6 |
File Size | 145995 |
File Format | |
ISSN | 00189464 |
Volume Number | 33 |
Issue Number | 3 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1997-05-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Ion beams Spin valves Magnetic properties Microstructure Sputtering Magnetic force microscopy Transmission electron microscopy X-ray diffraction Magnetic films Surface morphology |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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