NDLI: Fabrication and properties of multiple vertically stacked Josephson tunnel junctions

Content Provider	IEEE Xplore Digital Library
Author	Monaco, R. Polcari, A. Capogna, L.
Copyright Year	2002
Abstract	Vertically stacked Josephson tunnel junctions with a high number of junctions (up to n=20) were realized using a fabrication process based on the Nb/Al technology. An experimental study aimed toward their potential applications was made. First, we report on a series of DC measurements, with the main purpose of studying the quality of the I-V curve as a function of the number of barriers in the stack; we found that the junction quality slowly becomes worse as we increase this number. In fact, some thermal effects appear, which result in an increase of the subgap current and a decrease of the width of the current jump at the total gap voltage. Further, we found a low frequency voltage noise on devices with n>10 that depends on the junction area and on the substrate nature. Later, we discuss some RF properties of stacked junctions irradiated with a microwave signal. These measurements show that they seem to behave independently. Once again, the thermal effects drastically influence the response to an external RF drive and seem to limit the use for applications of these devices.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	32
Ending Page	37
Page Count	6
File Size	947685
File Format	PDF
ISSN	10518223
Volume Number	6
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fabrication Niobium Radio frequency Josephson junctions Superconducting microwave devices RF signals Insulation Low voltage Low-frequency noise Superconducting device noise
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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