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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Salsgiver, J. Stroble, C. Washko, S. |
| Copyright Year | 1965 |
| Abstract | Commercially-produced grain-oriented 3% SiFe is batch annealed in coil form thereby generating single crystal grains with slight amounts of misorientation as measured from grain edge to grain interior. When heat flattened, lattice bending occurs along with the generation of a dislocation substructure, the quantity and arrangement of which depend on deformation rate, amount of deformation and stress relief annealing temperature. The 60 Hz core losses at 1.5 and 1.7T were found to be very sensitive to the latter two parameters. Core losses were modeled as a function of dislocation substructure. A strong linear correlation between supplemental losses, which are associated with 90° domain wall motion, and dislocation density was found without regard to dislocation arrangement. A weaker correlation was found between the interaction of 180° domain walls and dislocation density, perhaps indicating that dislocation arrangement is important here. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 1548 |
| Ending Page | 1550 |
| Page Count | 3 |
| File Size | 542606 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 20 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1984-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Core loss Coils Strips Lattices Annealing Mass production Temperature Thickness measurement Grain size Residual stresses |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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