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Content Provider | IEEE Xplore Digital Library |
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Author | Schneider, D. Gloy, Y.-S. Merhof, D. |
Copyright Year | 1963 |
Abstract | A vision-based measurement system to quantify the yarn density of woven fabrics during production is presented. As an extension to an earlier developed fabric flaw detection system, the proposed framework consists of a combination of basic and custom-made image-processing techniques that allow to precisely track single wefts and warps within fabric images - in real-time. Several adaptations facilitate the measurement of density changes for plain, satin, and twill weaves. In this paper, the algorithmic framework has been evaluated in several comprehensive on-line experiments on a real-world air-jet loom and is additionally compared with three alternative methods for fabric density measurement. It proved to be precise, robust, and applicable for industrial use as it overcomes many of the existing shortcomings of current methods. |
Sponsorship | IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc |
Starting Page | 1063 |
Ending Page | 1074 |
Page Count | 12 |
File Size | 3583667 |
File Format | |
ISSN | 00189456 |
Volume Number | 64 |
Issue Number | 4 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2015-01-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Fabrics Yarn Weaving Density measurement Vectors Trajectory yarn density measurement. Fabric quality control machine vision algorithms textile inspection vision-based measurement (VBM) |
Content Type | Text |
Resource Type | Article |
Subject | Instrumentation Electrical and Electronic Engineering |
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