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Content Provider | IEEE Xplore Digital Library |
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Author | Friedrich, M. Dobie, G. Chung Chee Chan Pierce, S.G. Galbraith, W. Marshall, S. Hayward, G. |
Copyright Year | 2001 |
Abstract | In this paper, a wireless, multisensor inspection system for nondestructive evaluation (NDE) of materials is described. The sensor configuration enables two inspection modes-magnetic (flux leakage and eddy current) and noncontact ultrasound. Each is designed to function in a complementary manner, maximizing the potential for detection of both surface and internal defects. Particular emphasis is placed on the generic architecture of a novel, intelligent sensor platform, and its positioning on the structure under test. The sensor units are capable of wireless communication with a remote host computer, which controls manipulation and data interpretation. Results are presented in the form of automatic scans with different NDE sensors in a series of experiments on thin plate structures. To highlight the advantage of utilizing multiple inspection modalities, data fusion approaches are employed to combine data collected by complementary sensor systems. Fusion of data is shown to demonstrate the potential for improved inspection reliability. |
Sponsorship | IEEE Sensors Council |
Starting Page | 1439 |
Ending Page | 1448 |
Page Count | 10 |
File Size | 985973 |
File Format | |
ISSN | 1530437X |
Volume Number | 9 |
Issue Number | 11 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2009-11-01 |
Publisher Place | U.S.A. |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Condition monitoring Inspection Intelligent sensors Wireless sensor networks Eddy currents Ultrasonic imaging Computer architecture Testing Wireless communication Automatic control sensor platforms nondestructive evaluation (NDE) robotics |
Content Type | Text |
Resource Type | Article |
Subject | Instrumentation Electrical and Electronic Engineering |
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