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Content Provider | IEEE Xplore Digital Library |
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Author | Messner, G. |
Copyright Year | 1978 |
Abstract | A very rapid increase in the conductor density of various interconnecting substrates makes it desirable to have a uniform method for evaluation of their relative density capabilities. The derivation of one such method of evaluation, based on conductor density per unit of total area of the substrate, is made. This method permits a uniform density analysis of the entire interconnection spectrum from printed to integrated circuits. It is also useful in derivation of a price-density analysis and other figures of merits for assisting in the comparison of various packaging techniques. A description of a generalized approach for development of such a graphic price-density analysis is provided. |
Sponsorship | IEEE Electronic Industries Alliance American Society of Mechanical Engineering (ASME) NBS SAE |
Starting Page | 143 |
Ending Page | 151 |
Page Count | 9 |
File Size | 1257197 |
File Format | |
ISSN | 01486411 |
Volume Number | 10 |
Issue Number | 2 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1987-06-01 |
Publisher Place | U.S.A. |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Integrated circuit interconnections Wiring Conductors Integrated circuit packaging Large scale integration Printed circuits Graphics Very large scale integration Integrated circuit technology Density measurement |
Content Type | Text |
Resource Type | Article |
Subject | Industrial and Manufacturing Engineering Electronic, Optical and Magnetic Materials Engineering Electrical and Electronic Engineering |
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