NDLI: HTS Rf-SQUID Microscope for Metallic Contaminant Detection

Content Provider	IEEE Xplore Digital Library
Author	Takemoto, M. Akai, T. Kitamura, Y. Hatsukade, Y. Tanaka, S.
Copyright Year	2002
Abstract	We have developed metallic contaminant detection systems using HTS-SQUIDs. In this study, we designed and fabricated a single-chip HTS rf-SQUID using SQUID microscope techniques to reduce both the lift-off and cooling temperature as compared with the substrate resonator HTS rf-SQUID. The HTS rf-SQUID was a washer-type rf-SQUID without a flux focuser. By lengthening and narrowing the SQUID hole, we showed that the inductance of the SQUID ring was reduced, and the effective area and the field noise were improved consequently. By introducing a single-chip HTS rf-SQUID with hole size of 800 μm × 50 μm into the detection system, we obtained a field sensitivity of 150 fT/Hz^1/2 and a lift-off of 1.5 mm. Since this SQUID has advantages in the reduction of lift-off and cooling temperature, its detectability and magnetic field resolution are superior to that of the substrate resonator SQUID. Finally, we showed the single-chip SQUID can detect 20 μm in diameter iron balls.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	432
Ending Page	435
Page Count	4
File Size	549047
File Format	PDF
ISSN	10518223
Volume Number	21
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	SQUIDs High temperature superconductors Magnetometers Substrates Sensitivity Pollution measurement Superconducting magnets single-chip HTS rf-SQUID Detection magnetic contaminants
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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