NDLI: ESSENTIAL: an efficient self-learning test pattern generation algorithm for sequential circuits

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ESSENTIAL: an efficient self-learning test pattern generation algorithm for sequential circuits

Content Provider	IEEE Xplore Digital Library
Author	Schulz, M.H. Auth, E.
Copyright Year	1989
Description	Author affiliation: Dept. of Electr. Eng., Tech. Univ. of Munich, West Germany (Schulz, M.H.; Auth, E.)
Abstract	The authors present ESSENTIAL, deterministic automatic test pattern generation algorithm for sequential circuits. By combining reverse time processing over time frames and forward processing within time frames, ESSENTIAL avoids the detrimental a priori determination of a topological path to be sensitized or of a primary output, to which the fault effects have to be propagated. Moreover, the proposed test generation approach fully exploits the beneficial techniques that have successfully been used for combinational circuits by the automatic test pattern generation system SOCRATES. In particular, the authors discuss a learning procedure for global implications not only over reconvergent fanout, but also over time frames as well as static and dynamic unique sensitization techniques. After introducing a couple of intelligent heuristics employed for guiding and supporting the decision-making process, the authors report some preliminary but encouraging experimental results.
Starting Page	28
Ending Page	37
File Size	929254
Page Count	10
File Format	PDF
DOI	10.1109/TEST.1989.82274
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1989-08-29
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Test pattern generators Automatic test pattern generation Circuit testing Sequential circuits Circuit faults Automatic testing System testing Combinational circuits Coupling circuits Decision making
Content Type	Text
Resource Type	Article

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