NDLI: Single Event Upsets and Hot Pixels in digital imagers

Content Provider	IEEE Xplore Digital Library
Author	Chapman, G.H. Thomas, R. Thomas, R. Coelho Silva Meneses, K.J. Yang, T.Q. Koren, I. Koren, Z.
Copyright Year	2015
Description	Author affiliation: Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada (Chapman, G.H.; Thomas, R.; Thomas, R.; Coelho Silva Meneses, K.J.; Yang, T.Q.) \|\| Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA (Koren, I.; Koren, Z.)
Abstract	From extensive study of digital imager defects, we found that permanent “Hot Pixels” are the main long term digital camera defects, and are caused by high energy cosmic ray particles. Clearly, as in other microelectronic integrated circuits, most of the particles do not induce permanent damage but instead, inject a short term charge that may cause a transient fault, known as a Single Event Upset (SEU). Unlike standard digital ICs, pixels in a digital imaging sensor can be monitored at almost any desirable frequency. Since an SEU manifests itself as one or more brighter pixels in an otherwise dark image, the rate of SEUs can be measured at a considerably higher accuracy by taking dark-field pictures at different exposure times and different frequencies. In this paper we describe an experimental approach to measuring the occurrence rate and resulting characteristics of SEUs. The SEU rate that we have observed for digital imagers, of about 4 SEUs for every 30 seconds, is considerably higher than was previously reported for ordinary ICs. For the same imager, permanent hot pixels have a rate of 1 every 12.6 days, while SEUs occur 145,000 times more often. Ordinary IC SEU rates have been reported to be about 100× of permanent fault rates. In addition, we found that some SEUs in digital imagers do not impact a single pixel, as do hot pixels, but can create a line of injected charges which appears as a bright line in the dark image.
Starting Page	41
Ending Page	46
File Size	3285500
Page Count	6
File Format	PDF
e-ISBN	9781479986064
DOI	10.1109/DFT.2015.7315133
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-10-12
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	ISO Standards Single event upsets ISO Cameras Digital images Lighting imager defects hot pixel SEU active pixel sensor APS CCD
Content Type	Text
Resource Type	Article

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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