NDLI: Using neural networks for functional testing

Content Provider	IEEE Xplore Digital Library
Author	Kirkland, L.V. Wright, R.G.
Copyright Year	1995
Description	Author affiliation: OO-ALC/TISA USAF, Hills AFB, UT, USA (Kirkland, L.V.)
Abstract	This paper discusses using Neural Networks for diagnosing circuit faults. As a circuit is tested, the output signals from a Unit Under Test can vary as different functions are invoked by the test. When plotted against time, these signals create a characteristic trace for the test performed. Sensors in the ATS can be used to monitor the output signals during test execution. Using such an approach, defective components can be classified using a Neural Network according to the pattern of variation from that exhibited by a known good card. This provides a means to develop testing strategies for circuits based upon observed performance rather than domain expertise. Such capability is particularly important with systems whose performance, especially under faulty conditions, is not well documented or where suitable domain knowledge and experience does not exist. Thus, neural network solutions may in some application areas exhibit better performance than either conventional algorithms or knowledge-based systems. They may also be retrained periodically as a background function, resulting with the network gaining accuracy over time.
Starting Page	508
Ending Page	511
File Size	292613
Page Count	4
File Format	PDF
ISBN	0780326210
DOI	10.1109/AUTEST.1995.522718
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-08-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Neural networks Circuit testing Monitoring Circuit faults Computer architecture Sensor phenomena and characterization Knowledge based systems Fluctuations Pattern recognition Application software
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
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8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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