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Content Provider | IEEE Xplore Digital Library |
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Author | Hosain, S.I. Meunier, J.P. |
Copyright Year | 1989 |
Abstract | The authors have proposed (1991) a simple method for predicting the index profile parameter (the profile exponent q in case of a power law profile or the aspect ratio S in case of trapezoidal index profile) of a graded-index optical fiber which is single moded in the 1.3-1.55 mu m wavelength range from a measurement of the LP/sub 11/ and LP/sub 02/ cutoff wavelengths. They extend the method with appropriate modification to determine the asymmetry parameter sigma , the maximum refractive index n/sub f/ and the characteristic thickness d of the guiding layer of a few-moded graded-index asymmetric planar optical waveguide from a measurement of the TE/sub 0/ and TE/sub 1/ cutoff wavelengths. The method is simple and can give firsthand information about these parameters with reasonably good accuracy.< |
Sponsorship | IEEE Lasers and Electro-Optics Society |
Starting Page | 801 |
Ending Page | 803 |
Page Count | 3 |
File Size | 296862 |
File Format | |
ISSN | 10411135 |
Volume Number | 3 |
Issue Number | 9 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1991-09-01 |
Publisher Place | U.S.A. |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Optical waveguides Optical planar waveguides Planar waveguides Optical refraction Optical variables control Wavelength measurement Charge carrier processes Optical fibers Power measurement |
Content Type | Text |
Resource Type | Article |
Subject | Electrical and Electronic Engineering Atomic and Molecular Physics, and Optics Electronic, Optical and Magnetic Materials |
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